شماره ركورد كنفرانس :
5328
عنوان مقاله :
Structural and Optical Study of Ni-Cu thin films with the different copper percentage
پديدآورندگان :
Goudarzi Goudarzi Samira Department of Physics, Malayer University, Malayer, Ira , Dalouji Vali dalouji@yahoo.com Department of Physics, Malayer University, Malayer, Iran
كليدواژه :
thin films , Atomic Force Microscopy (AFM) , Optical properties
عنوان كنفرانس :
بيست و سومين كنفرانس شيمي فيزيك انجمن شيمي ايران
چكيده فارسي :
In this paper, we report co-deposition of RF-sputtering and RF-PECVD for growth of Ni NPs @ a-C: H with different percentages of Cu. We studied optical constants of Ni-Cu thin films, with constant Ni content and different percentages of 5%, 40%, and 75 % from Cu atoms. With the increase of Cu percentage, the RMS roughness of films was decreased. All films exhibit a reflectance and transmittance of about 20% and 50%, respectively.
