Author/Authors
Gençyılmaz, Olcay Çankırı Karatekin University - Faculty of Science - Department of Physics, Turkey , Atay, Ferhunde Eskişehir Osmangazi University - Faculty of Art and Science - Department of Physics, Turkey , Akyüz, İdris Eskişehir Osmangazi University - Faculty of Art and Science - Department of Physics, Turkey
Title Of Article
Variable-Angle Spectroellipsometric Characterization of CdS Thin Films
شماره ركورد
36013
Abstract
In this work, CdS thin films produced by ultrasonic spray pyrolysis technique. The optical properties of CdS thin films were investigated using spectroscopic ellipsometry and UV-VIS Spectrophotometer. The optical properties of CdS thin films coated glass substrates were evaluated by variable-angle spectroscopic ellipsometry. Variable angle spectroscopic ellipsometry was used for thickness and optical constant calculations. Multiple angle measurements were taken in the most sensitive angle of incidence region. Appropriate incident angle were obtained as experimental using graph of ψ and Δ. Cauchy-Urbach model was used to determine the thickness, refractive index and extinction coefficient for CdS thin films. Also, transmittance measurements and band gap values of the films was examined by UV-VIS spectrophotometer and optical method, respectively. Finally, the incidence angle effects were discussed on the optical properties of CdS thin films such as thickness and optical constant (refractive index and extinction coefficient).
From Page
137
NaturalLanguageKeyword
CdS thin film , spectroscopic ellipsometry , thickness , optical constants and transmittance
JournalTitle
Süleyman Demirel University Faculty of Arts and Science Journal of Science
To Page
146
JournalTitle
Süleyman Demirel University Faculty of Arts and Science Journal of Science
Link To Document