مرکز منطقه ای اطلاع رساني علوم و فناوري - XRD and SEM analysis of Ag-Doped BiPbSrCaCuO Seramics

Abstract :

The effects of Ag dopant on the properties of high temperature superconductor Bi1,64-xPb0,36AgxSr2Ca2Cu3Oy were investigated. The samples were prepared by doping Ag with changing ratios (x = 0.00–0.16) by a solid state reaction method. Characterization of the samples was carried out by powder X-ray diffraction (XRD) method and morphology of the grains in the samples were determined by using scanning electron microscope (SEM). The X-ray diffraction studies were done at room temperature and the lattice constants of the materials were determined by indexing all the peaks observed. In the patterns of XRD, we observed two different phases which are high-Tc (2223) and low-Tc (2212) phases in our samples. By using these patterns it was estimated volume fraction from the intensities of Bi-(2223) and Bi-(2212) phases. We obtained the highest volume fraction of the Bi-(2223) high-Tc phase at the samples with x = 0.16. Additionaly, we observed a noticeable change of the grain size in the SEM analysis. The difference in the grain size and the distribution of grains in the samples indicate the influence of different wt% of Ag on the morphology of the samples.