Author/Authors :
Etienne Deloule، نويسنده , , Michael Wiedenbeck، نويسنده ,
DocumentNumber :
1263883
Title Of Article :
Analytical Developments in Secondary Ion Mass Spectrometry 2003
شماره ركورد :
7757
From Page :
37
NaturalLanguageKeyword :
U-Pb , reference samples , zircon , NanoSIMS , time-of-flight SIMS. , Review , geochronology , secondary ion mass spectrometry
JournalTitle :
Studia Iranica
To Page :
40
To Page :
40
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=44&DC=7757
