• DocumentCode
    1000092
  • Title

    Single fault location in a linear analogue system with variable sensitivity matrix

  • Author

    Tong, K.Y.

  • Author_Institution
    Hong Kong Polytechnic, Department of Electronic Engineering, Kowloon, Hong Kong
  • Volume
    16
  • Issue
    6
  • fYear
    1980
  • Firstpage
    221
  • Lastpage
    222
  • Abstract
    A method of locating a single fault in a linear analogue system by determining the consistency of the inaccessible nodal voltage vectors is proposed. It does not require the assumption of an invariable sensitivity matrix, and can thus be applied to catastrophe faults as well.
  • Keywords
    electronic equipment testing; fault location; ATE; automatic test equipment; linear analogue system; single fault location; variable sensitivity matrix;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19800158
  • Filename
    4249603
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1000092