Coherent frequency-domain reflectometry for characterization of single-mode integrated-optical waveguides

Based on the principles of optical frequency domain reflectometry (OFDR), a highly resolving and sensitive technique suitable for detecting, localizing, and quantifying weakly reflecting irregularities in single-mode optical waveguides is developed. A distributed feedback (DFB)-laser diode at λ₀≅1.3 μm tuned within a range of Δλ≅6 nm and Δv≅1 THz, respectively, is used as a source in the experimental arrangement. An auxiliary interferometer is employed so that the tuning need not be linear in time, in contrast to early implementations. At present, with waveguide structures on InP under test, a spatial resolution of 50 μm and a dynamic range of about 60 dB are obtained. These data surpass OFDR results published so far. Prospects of closing the gap to coherence-domain reflectometric results and specific advantages make OFDR a promising technique