Coherent frequency-domain reflectometry for characterization of single-mode integrated-optical waveguides

Author

Glombitza, U. ; Brinkmeyer, E.

Author_Institution

Tech, Univ, Hamburg-Harburg, Germany

Volume

11

Issue

8

fYear

1993

fDate

8/1/1993 12:00:00 AM

Firstpage

1377

Lastpage

1384

Abstract

Based on the principles of optical frequency domain reflectometry (OFDR), a highly resolving and sensitive technique suitable for detecting, localizing, and quantifying weakly reflecting irregularities in single-mode optical waveguides is developed. A distributed feedback (DFB)-laser diode at λ₀≅1.3 μm tuned within a range of Δλ≅6 nm and Δv≅1 THz, respectively, is used as a source in the experimental arrangement. An auxiliary interferometer is employed so that the tuning need not be linear in time, in contrast to early implementations. At present, with waveguide structures on InP under test, a spatial resolution of 50 μm and a dynamic range of about 60 dB are obtained. These data surpass OFDR results published so far. Prospects of closing the gap to coherence-domain reflectometric results and specific advantages make OFDR a promising technique

Keywords

integrated optics; optical resolving power; optical testing; optical waveguides; reflectometry; sensitivity; 1.3 micron; DFB laser diode; IR; InP; auxiliary interferometer; distributed feedback; dynamic range; highly resolving; laser tuning; light coherence; optical frequency domain reflectometry; sensitive technique; single-mode integrated-optical waveguides; spatial resolution; waveguide structures; weakly reflecting irregularities; Diodes; Distributed feedback devices; Frequency domain analysis; Indium phosphide; Optical feedback; Optical interferometry; Optical sensors; Optical waveguides; Reflectometry; Testing;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.254098

Filename

254098