Title :
Skin Effect in Rectangular Conductors A Method of Measurement and Experimental Data
Author :
Forbes, H.C. ; Gorman, L.J.
Author_Institution :
The New York Edison Company, New York, N. Y.
fDate :
6/1/1933 12:00:00 AM
Keywords :
Ammeters; Circuit testing; Conductors; Current measurement; Electrical resistance measurement; Frequency measurement; Proximity effect; Skin effect;
Journal_Title :
American Institute of Electrical Engineers, Transactions of the
DOI :
10.1109/T-AIEE.1933.5056342
