• DocumentCode
    1001063
  • Title

    Computer-Aided-Design Research at the Ge Microelectronics Center

  • Author

    Hightower, David ; de Geus, Aart ; Fasang, Patrick ; Griffin, Robert ; Leive, Gary

  • Author_Institution
    General Electric Corporation
  • Volume
    3
  • Issue
    5
  • fYear
    1986
  • Firstpage
    49
  • Lastpage
    56
  • Abstract
    In late 1980, the GE Microelectronics Center (MEC) was established to develop a proprietary gate array program for infusing JC technology into GE products. One team developed a CAD system helping engineers through the complete design cycle from circuit description capture and simulation to layout, post-layout simulation, processing, and test. Another team developed a gate array CMOS process at the 1 ¿ fabrication facility in North Carolina´s Research Triangle Park opened in June 1982.
  • Keywords
    CMOS process; CMOS technology; Circuit simulation; Circuit testing; Computational modeling; Design automation; Design engineering; Microelectronics; System testing; Systems engineering and theory;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1986.295066
  • Filename
    4069871