DocumentCode
1001063
Title
Computer-Aided-Design Research at the Ge Microelectronics Center
Author
Hightower, David ; de Geus, Aart ; Fasang, Patrick ; Griffin, Robert ; Leive, Gary
Author_Institution
General Electric Corporation
Volume
3
Issue
5
fYear
1986
Firstpage
49
Lastpage
56
Abstract
In late 1980, the GE Microelectronics Center (MEC) was established to develop a proprietary gate array program for infusing JC technology into GE products. One team developed a CAD system helping engineers through the complete design cycle from circuit description capture and simulation to layout, post-layout simulation, processing, and test. Another team developed a gate array CMOS process at the 1 ¿ fabrication facility in North Carolina´s Research Triangle Park opened in June 1982.
Keywords
CMOS process; CMOS technology; Circuit simulation; Circuit testing; Computational modeling; Design automation; Design engineering; Microelectronics; System testing; Systems engineering and theory;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1986.295066
Filename
4069871
Link To Document