DocumentCode
1001132
Title
The influence of radiation damage on the superconducting properties of thin film YBa2Cu3O7-δ
Author
Chrisey, D.B. ; Summers, G.P. ; Knudson, A.R.
Author_Institution
US Naval Res. Lab., Washington, DC
Volume
35
Issue
6
fYear
1988
fDate
12/1/1988 12:00:00 AM
Firstpage
1456
Lastpage
1460
Abstract
The authors report measurements of the effects of high-energy (~60 MeV) H and He ion irradiation of thin films of YBa2Cu3 O7-δ produced by plasma-arc spray and laser evaporation, and of low-energy (~10 MeV) B and N ion irradiation of laser evaporated films. The observed changes in the resistance versus temperature behavior for H and He ion irradiation of the plasma-arc spray films are much more dramatic than that observed for films produced by other techniques and resembles, qualitatively, a bond percolation threshold. In contrast, high-energy H and He ion irradiation of the laser-evaporated films resulted in a negligible change in the resistance-temperature behavior. Low-energy B and N ion irradiation of laser-evaporated films gradually lowered the completion temperature of the superconducting transition
Keywords
barium compounds; boron; helium; high-temperature superconductors; hydrogen; ion beam effects; laser beam applications; nitrogen; plasma arc sprayed coatings; radiation hardening (electronics); superconducting thin films; superconducting transition temperature; vacuum deposition; yttrium compounds; 10 MeV; 60 MeV; B ions; H ions; He ions; N ions; YBa2Cu3O7-δ; bond percolation threshold; completion temperature; high temperature superconductors; influence of radiation damage; laser evaporated films; laser evaporation; plasma-arc spray films; resistance-temperature behavior; superconducting properties; Bonding; Helium; Laser transitions; Plasma measurements; Plasma properties; Plasma temperature; Superconducting films; Superconducting thin films; Superconducting transition temperature; Thermal spraying;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.25480
Filename
25480
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