• DocumentCode
    1001260
  • Title

    Capacitance and Loss Variations with Frequency And Temperature in Composite Insulation

  • Author

    Race, Hubert H.

  • Author_Institution
    Research Laboratories, General Electric Co., Schenectady, N. Y.
  • Volume
    52
  • Issue
    2
  • fYear
    1933
  • fDate
    6/1/1933 12:00:00 AM
  • Firstpage
    682
  • Lastpage
    689
  • Abstract
    Variations in electrical properties of composite insulation with changes in temperature and frequency are important because they lead to concepts of physical causes of such variations and, therefore, indicate how to obtain improved electrical properties in commercial materials. Typical experimental data are presented showing the capacitance and loss characteristics of synthetic resin laminated materials and of imperfect composite dielectrics made from combinations of fused quartz or glass and semi-conducting liquids. An example is given showing agreement between calculated and observed characteristics of such a glass-liquid combination. Theoretical analyses are given, showing that the general form of the capacitance and loss characteristics could be caused by any one of several physical mechanisms. As a result of these studies it seems probable that in synthetic resin laminated products semi-conducting materials in small insulated pockets or fibers can account for observed characteristics and can be represented mathematically by the Maxwell-Wagner theory. It is also shown that capacitance and loss measurements at one frequency and temperature cannot generally be used to predict corresponding values under different conditions.
  • Keywords
    Capacitance; Capacitance-voltage characteristics; Composite materials; Dielectric liquids; Dielectric losses; Dielectric materials; Dielectrics and electrical insulation; Frequency; Resins; Temperature;
  • fLanguage
    English
  • Journal_Title
    American Institute of Electrical Engineers, Transactions of the
  • Publisher
    ieee
  • ISSN
    0096-3860
  • Type

    jour

  • DOI
    10.1109/T-AIEE.1933.5056370
  • Filename
    5056370