• DocumentCode
    1001604
  • Title

    Analysis of mismatch effects among A/D converters in a time-interleaved waveform digitizer

  • Author

    Petraglia, Antonio ; Mitra, Sanjit K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
  • Volume
    40
  • Issue
    5
  • fYear
    1991
  • fDate
    10/1/1991 12:00:00 AM
  • Firstpage
    831
  • Lastpage
    835
  • Abstract
    High-speed A/D conversion can be achieved by employing a parallel array of M A/D converters interleaved in time, each working at 1/Mth of the sampling rate. Theoretically, the resolution of the structure is given by the resolution of the A/D converters in the array (subconverters). In practice, however, mismatches among the subconverters lead to a decrease in the resolution. The effect of such mismatches is analyzed in terms of a signal-to-noise ratio defined as the ratio between the energy of the input analog signal and the energy of the error signal due exclusively to these mismatches. The analysis shows that the distortion is comparable to that generated by nonuniform sample timing in the analog demultiplexer when converting a single high-speed signal into several low-speed sampled-and-held signals. The results of the analysis can be used to specify the degree of precision to be achieved in an actual monolithic implementation
  • Keywords
    analogue-digital conversion; monolithic integrated circuits; signal processing equipment; A/D converters; GaAs MESFET; analog demultiplexer; bipolar Si technology; distortion; energy; error signal; mismatch effects; monolithic implementation; nonuniform sample timing; parallel array; precision; signal-to-noise ratio; subconverters; time-interleaved waveform digitizer; time-multiplexed array; Clocks; Energy resolution; Power generation economics; Sampling methods; Signal analysis; Signal processing; Signal resolution; Signal to noise ratio; Uncertainty; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.106306
  • Filename
    106306