DocumentCode
1001641
Title
A distribution function for double-bit upsets
Author
Edmonds, L.D.
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Volume
36
Issue
2
fYear
1989
fDate
4/1/1989 12:00:00 AM
Firstpage
1344
Lastpage
1346
Abstract
It is suggested that the chord length distribution method could be useful for predicting double-bit upset rates in certain circumstances. A chord length distribution function for simultaneous path lengths in two parallelepipeds, applicable to a unidirectional flux, is derived. A proof of the system is outlined for the case under consideration
Keywords
fusion reactor theory and design; plasma theory; chord length distribution method; distribution function; double-bit upsets; parallelepipeds; unidirectional flux; Conductors; Contracts; Delay; Distribution functions; Equations; Propulsion; Semiconductor device modeling; Space technology; Testing; Writing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.25527
Filename
25527
Link To Document