Title :
Process-Variation-Calibrated Multiphase Delay Locked Loop With a Loop-Embedded Duty Cycle Corrector
Author :
Kyungho Ryu ; Dong-Hoon Jung ; Seong-Ook Jung
Author_Institution :
Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
Abstract :
A multiphase delay locked loop (DLL) that can calibrate the interphase error and guarantee the 50% duty cycle of the output clock of the DLL is presented. The proposed process variation calibration architecture is implemented without the need for complex circuitry because it calibrates the phase error using a simple delay averaging operation among four 90° shifters. In addition, a loop-embedded duty cycle corrector is implemented with extremely small power and area requirements by adopting feedforward and feedback paths. Finally, a sense-amplifier-based phase detector is proposed for reducing dithering jitter. The proposed DLL is fabricated using a 0.13- μm CMOS process. For the seven test chips analyzed, the proposed DLL had a maximum phase error of 1.8° and a duty cycle error of 0.97% at 800 MHz.
Keywords :
CMOS analogue integrated circuits; delay lock loops; jitter; phase detectors; CMOS process; DLL output clock duty cycle; delay averaging operation; dithering jitter reduction; duty cycle error; feedback path; feedforward path; frequency 800 MHz; interphase error; loop-embedded duty cycle corrector; multiphase DLL; process-variation-calibrated multiphase delay locked loop; sense-amplifier-based phase detector; size 0.13 mum; Calibration; Clocks; Delays; Detectors; Image edge detection; Jitter; Laser mode locking; Delay locked loop (DLL); duty cycle corrector (DCC); multiphase; process variation;
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2013.2291052