DocumentCode :
1001802
Title :
Physics-based compact model of nanoscale MOSFETs-Part I: transition from drift-diffusion to ballistic transport
Author :
Mugnaini, Giorgio ; Iannaccone, Giuseppe
Author_Institution :
Dipt. di Ingegneria dell´´Informazione, Univ. di Pisa, Italy
Volume :
52
Issue :
8
fYear :
2005
Firstpage :
1795
Lastpage :
1801
Abstract :
In this paper, we present a physics-based analytical model for nanoscale MOSFETs that allows us to seamlessly cover the whole range of regimes from drift-diffusion (DD) to ballistic (B) transport, taking into account quantum confinement in the channel. In Part I we focus on MOSFETs with ultrathin bodies, in which quantum confinement is structural rather than field-induced, and investigate in detail an analytical description of the transition from drift-diffusion to B transport based on the Büttiker approach to dissipative transport. We first start from the derivation of a closed form analytical expression of the Natori model for B MOSFETs, and show that a MOSFET with finite scattering length can be described as a suitable chain of B MOSFETs. Then, we are able to compact the behavior of the B chain in a simple analytical model. In the derivation, we also find a similarity between the B limit in the chain and the saturation velocity effect, that leads us to propose an alternative implementation of the saturation velocity effect in compact models.
Keywords :
MOSFET; ballistic transport; nanoelectronics; semiconductor device models; Natori model; ballistic transport; closed form analytical expression; dissipative transport; drift-diffusion transport; finite scattering length; nanoscale MOSFET; physics-based compact model; quantum confinement; saturation velocity effect; ultrathin bodies; Analytical models; Ballistic transport; Circuit simulation; Curve fitting; Differential equations; Electrostatics; MOSFET circuits; Particle scattering; Potential well; Surface fitting; Ballistic transport; Lambert; compact models; nanoscale MOSFETs; quantum confinement;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2005.851827
Filename :
1468370
Link To Document :
بازگشت