Title :
Optical code-division multiple access using broad-band parametrically generated light
Author :
Pe´er, Avi ; Dayan, Barak ; Silberberg, Yaron ; Friesem, Asher A.
Author_Institution :
Dept. of Phys. of Complex Syst., Weizmann Inst. of Sci., Israel
fDate :
6/1/2004 12:00:00 AM
Abstract :
A novel approach for an optical direct-sequence spread spectrum is presented. It is based on the complementary processes of broad-band parametric down-conversion and up-conversion. With parametric down-conversion, a narrow-band continuous-wave (CW) optical field is transformed into two CW broad-band white-noise fields that are complex conjugates of each other. These noise fields are exploited as the key and conjugate key in optical direct-sequence spread spectrum. The inverse process of parametric up-conversion is then used for multiplying the key by the conjugate key at the receiver in order to extract the transmitted data. A complete scheme for optical code-division multiple access (OCDMA) based on this approach is presented. The salient feature of the approach presented in this paper is that an ideal white-noise key is automatically generated, leading to high-capacity versatile code-division multiple-access configurations.
Keywords :
code division multiple access; code division multiplexing; optical frequency conversion; optical receivers; spread spectrum communication; white noise; broad-band parametric downconversion; broad-band parametric upconversion; communication channel multiplexing; conjugate key; cw broad-band white noise fields; inverse process; narrow-band continuous-wave optical field; optical code division multiple access; optical direct sequence spread spectrum; white-noise key; Bandwidth; Bit rate; Multiaccess communication; Nonlinear optics; Optical noise; Optical receivers; Optical transmitters; Quality of service; Resource management; Spread spectrum communication; CDMA; Code-division multiple access; optical spread spectrum; parametric down-conversion; parametric up-conversion;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2004.827661