Title :
Syndrome- and autocorrelation-testable internally unate combinational networks
Author :
Eris, E. ; Muzio, J.C.
Author_Institution :
University of Victoria, Department of Computer Science, Victoria, Canada
Abstract :
It is known that all unate lines of an internally unate realisation of a boolean function are syndrome-testable. For other lines in a circuit there have been a number of suggestions for hardware modifications to ensure that a circuit is syndrome-testable. The letter proposes, as an alternative to hardware modification, augmenting the syndrome testing with auto-correlation testing.
Keywords :
combinatorial circuits; logic testing; Boolean function; autocorrelation testing; internally unate combinational networks; internally unate realisation; syndrome-testable; unate line;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19840177