• DocumentCode
    1001998
  • Title

    Direct extraction of equivalent circuit parameters for balun on silicon substrate

  • Author

    Xiong, Yong Zhong ; Teo, T. Hui ; Fu, J.S.

  • Author_Institution
    Integrated Circuit & Syst. Lab., Inst. of Microelectron., Singapore
  • Volume
    52
  • Issue
    8
  • fYear
    2005
  • Firstpage
    1915
  • Lastpage
    1916
  • Abstract
    A direct extraction technique of equivalent circuit parameters for three-port balun on silicon substrate is developed. The extraction is based on two-port measurement instead of three-port by grounding the third port. This technique greatly simplified the measurement and extraction process. The extracted results are in excellent agreement with the measured results up to 10 GHz.
  • Keywords
    CMOS integrated circuits; baluns; equivalent circuits; silicon; two-port networks; CMOS; direct extraction technique; equivalent circuit parameters; three-port balun; two-port measurement; Coupling circuits; Electrical resistance measurement; Equivalent circuits; Frequency; Impedance matching; Inductance; Measurement standards; Radiofrequency integrated circuits; Silicon; Solid modeling; Balun; CMOS; direct extraction; equivalent circuit;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2005.851851
  • Filename
    1468387
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1001998