Title :
New methodology to evaluate the performance of ring resonators using optical low-coherence reflectometry
Author :
Gottesman, Y. ; Rao, E.V.K. ; Rabus, D.G.
Author_Institution :
Centre Nat. de la Recherche Scientifique, CNRS, Marcoussis, France
fDate :
6/1/2004 12:00:00 AM
Abstract :
This paper describes the efficient implementation of optical low-coherence reflectometry (OLCR) measurements to evaluate the performance of InP-based high-index contrast ring resonators. Using examples of racetrack ring resonators, this paper shows here for the first time that all characteristic parameters relevant to resonator design (coupling coefficient k, propagation losses a, and optical cavity length L), and ultimately its performance, can be extracted in a straightforward manner. This is accomplished by introducing a new methodology that implicates OLCR measurements in transmission and also reflection modes as an alternative approach, in comparison with conventional spectral analysis, to extract resonator design parameters.
Keywords :
III-V semiconductors; indium compounds; optical resonators; optical variables measurement; reflectometry; InP-based high-index contrast ring resonators; coupling coefficient; optical cavity length; optical low-coherence reflectometry; propagation losses; racetrack ring resonators; reflection modes; resonator design parameters; semiconductor-based high-index contrasted microring resonators; transmission modes; Optical coupling; Optical design; Optical filters; Optical reflection; Optical resonators; Optical ring resonators; Reflectometry; Resonator filters; Spectral analysis; Wavelength division multiplexing; Filter analysis; OLCR; WDM; integrated optics; interferograms and reflectograms; optical low-coherence reflectometry; racetrack-shaped resonators; ring design parameters; ring resonators; transmission and reflection modes; wavelength-division multiplexing;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2004.829216