DocumentCode :
1002294
Title :
A new swept-frequency permeameter for measuring the complex permeability of thin magnetic films
Author :
Grimes, Craig A. ; Trouilloud, Philip L. ; Walser, Rodger M.
Author_Institution :
Dept. of Electr. Eng. & Comput. Eng., Texas Univ., Austin, TX, USA
Volume :
24
Issue :
1
fYear :
1988
fDate :
1/1/1988 12:00:00 AM
Firstpage :
603
Lastpage :
610
Abstract :
A permeameter is described that measures the complex permeability of anisotropic thin magnetic films over a continuous frequency spectrum. The system resolves the permeability into both real and imaginary parts, or magnitude and phase. The frequency span of the permeameters, 0.1-200 MHz, is larger than that of previously reported permeameters. The system has a measurement error of approximately 1%, which for the samples used here corresponds to a low-level permeance detection limit of about 1 μm, an order of magnitude below the previously reported low level limit of 13 μm. The system is both compact in size and convenient to use, with measurements taken over the whole frequency range in less than a minute
Keywords :
magnetic permeability measurement; magnetic thin films; 0.1 to 200 MHz; anisotropic thin magnetic films; complex permeability measurement; continuous frequency spectrum; imaginary parts; magnitude; measurement error; phase; real parts; swept-frequency permeameter; Anisotropic magnetoresistance; Coaxial components; Frequency measurement; Magnetic anisotropy; Magnetic films; Magnetic flux; Magnetic heads; Magnetic resonance; Permeability measurement; Perpendicular magnetic anisotropy; Testing; Toroidal magnetic fields;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.43991
Filename :
43991
Link To Document :
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