Title :
Optimal interconnect diagnosis of wiring networks
Author :
Shi, Weiping ; Fuchs, W. Kent
Author_Institution :
Dept. of Comput. Sci., North Texas Univ., Denton, TX, USA
Abstract :
Interconnect diagnosis is an important problem in very large scale integration (VLSI), multichip module (MCM) and printed circuit board (PCB) production. The problem is to detect and locate all the shorts, opens and stuck-at faults among a set of nets using the minimum number of parallel tests. In this paper, we present worst-case optimal algorithms and lower bounds to several open problems in interconnect diagnosis.<>
Keywords :
VLSI; circuit analysis computing; fault diagnosis; multichip modules; printed circuits; MCM; PCB production; VLSI; lower bounds; multichip modules; opens; optimal interconnect diagnosis; parallel tests; printed circuit board; shorts; stuck-at faults; very large scale integration; wiring networks; worst-case optimal algorithms; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Integrated circuit interconnections; Multichip modules; Printed circuits; Production; Very large scale integration; Wiring;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
