Title :
Electron beam controlled latch operating under electron beam testing conditions
Author :
Nouet, Pascal ; Girard, P.
Author_Institution :
Univ. des Sci. et Tech. du Languedoc, Montpellier, France
Abstract :
The principle of a latch controlled by an electron beam is presented. Based on experimental results, electron beam switching (active role) and electron beam testing (passive role) are demonstrated and conditions for E-beam sensitivity of the latch are discussed.
Keywords :
electron beam applications; flip-flops; logic testing; E-beam sensitivity; electron beam control; electron beam switching; electron beam testing; latch;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19920024
