DocumentCode :
1002654
Title :
Highly Interleaved 5-bit, 250-MSample/s, 1.2-mW ADC With Redundant Channels in 65-nm CMOS
Author :
Ginsburg, Brian P. ; Chandrakasan, Anantha P.
Author_Institution :
Texas Instrum., Dallas, TX, USA
Volume :
43
Issue :
12
fYear :
2008
Firstpage :
2641
Lastpage :
2650
Abstract :
This successive approximation register ADC uses time-interleaving to gain the energy advantage of slower circuits (reduced supply voltage and improved bias points) without sacrificing high speed operation. The drawbacks of interleaving are addressed through architectural solutions. Channel redundancy counteracts the severe yield loss that parallel circuits experience due to local variation. Clock partitioning restricts the distribution of the precise, high-speed sampling clock to three centrally located sampling networks. Only a low frequency clock is distributed across the majority of die area. The skew-resistant global top-plate sampling network is extended to allow overlapped sampling windows without introducing extra sources of crosstalk. The 36 -way interleaved 5-bit ADC operates with a core voltage of 800 mV and consumes 1.20 mW total power at 250 MS/s. At Nyquist, the SNDR is 28.4 dB. The 6 redundant channels (17% overhead) increase the yield of the 24 measured chips from 42% to 88%.
Keywords :
CMOS integrated circuits; Nyquist criterion; analogue-digital conversion; clocks; crosstalk; signal processing equipment; 36-way interleaved 5-bit ADC; Nyquist; approximation register ADC; channel redundancy; clock partitioning; crosstalk; high-speed sampling clock; low frequency clock; parallel circuits; power 1.20 mW; skew-resistant global top-plate sampling network; time-interleaving; voltage 800 mV; Analog circuits; Calibration; Circuit topology; Clocks; Energy efficiency; Interleaved codes; Redundancy; Registers; Sampling methods; Voltage; ADC; SAR; deep submicron CMOS; time- interleaving;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2008.2006334
Filename :
4684623
Link To Document :
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