• DocumentCode
    1002654
  • Title

    Highly Interleaved 5-bit, 250-MSample/s, 1.2-mW ADC With Redundant Channels in 65-nm CMOS

  • Author

    Ginsburg, Brian P. ; Chandrakasan, Anantha P.

  • Author_Institution
    Texas Instrum., Dallas, TX, USA
  • Volume
    43
  • Issue
    12
  • fYear
    2008
  • Firstpage
    2641
  • Lastpage
    2650
  • Abstract
    This successive approximation register ADC uses time-interleaving to gain the energy advantage of slower circuits (reduced supply voltage and improved bias points) without sacrificing high speed operation. The drawbacks of interleaving are addressed through architectural solutions. Channel redundancy counteracts the severe yield loss that parallel circuits experience due to local variation. Clock partitioning restricts the distribution of the precise, high-speed sampling clock to three centrally located sampling networks. Only a low frequency clock is distributed across the majority of die area. The skew-resistant global top-plate sampling network is extended to allow overlapped sampling windows without introducing extra sources of crosstalk. The 36 -way interleaved 5-bit ADC operates with a core voltage of 800 mV and consumes 1.20 mW total power at 250 MS/s. At Nyquist, the SNDR is 28.4 dB. The 6 redundant channels (17% overhead) increase the yield of the 24 measured chips from 42% to 88%.
  • Keywords
    CMOS integrated circuits; Nyquist criterion; analogue-digital conversion; clocks; crosstalk; signal processing equipment; 36-way interleaved 5-bit ADC; Nyquist; approximation register ADC; channel redundancy; clock partitioning; crosstalk; high-speed sampling clock; low frequency clock; parallel circuits; power 1.20 mW; skew-resistant global top-plate sampling network; time-interleaving; voltage 800 mV; Analog circuits; Calibration; Circuit topology; Clocks; Energy efficiency; Interleaved codes; Redundancy; Registers; Sampling methods; Voltage; ADC; SAR; deep submicron CMOS; time- interleaving;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2008.2006334
  • Filename
    4684623