Title :
Six-port optical reflectometer
Author :
Zhang, Y. ; Colef, G. ; Li, Y. ; Eichmann, G.
Author_Institution :
Dept. of Electr. Eng., City Coll. of City Univ., New York, NY, USA
fDate :
10/1/1991 12:00:00 AM
Abstract :
A six-port optical reflectometer that can be used to measure the complex reflection coefficient of optical components is proposed. The frequency range of the six-port reflectometer can thus be extended to the optical range. Computer simulation and experimental results obtained with a prototype optical setup are presented
Keywords :
digital simulation; optical testing; optical variables measurement; reflectometers; complex reflection coefficient; computer simulation; prototype; six-port optical reflectometer; Calibration; Circuits; Computer simulation; Equations; Optical devices; Optical interferometry; Optical network units; Optical reflection; Power generation; Power measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
