Title :
A 128
128 Single-Photon Image Sensor With Column-Level 10-Bit Time-to-Digital Converter Array
Author :
Niclass, Cristiano ; Favi, Claudio ; Kluter, Theo ; Gersbach, Marek ; Charbon, Edoardo
Author_Institution :
Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne
Abstract :
An imager for time-resolved optical sensing was fabricated in CMOS technology. The sensor comprises an array of 128times128 single-photon pixels, a bank of 32 time-to-digital-converters, and a 7.68 Gbps readout system. Thanks to the outstanding timing precision of single-photon avalanche diodes and the optimized measurement circuitry, a typical resolution of 97 ps was achieved within a range of 100 ns. To the best of our knowledge, this imager is the first fully integrated system for photon time-of-arrival evaluation. Applications include 3-D imaging, optical rangefinding, fast fluorescence lifetime imaging, imaging of extremely fast phenomena, and, more generally, imaging based on time-correlated single photon counting. When operated as an optical rangefinder, this design has enabled us to reconstruct 3-D scenes with milimetric precisions in extremely low signal exposure. A laser source was used to illuminate the scene up to 3.75 m with an average power of 1 mW, a field-of-view of 5deg and under 150 lux of constant background light. Accurate distance measurements were repeatedly achieved based on a short integration time of 50 ms even when signal photon count rates as low as a few hundred photons per second were available.
Keywords :
CMOS image sensors; avalanche diodes; fluorescence; optical sensors; sensor arrays; time resolved spectra; 3-D imaging; CMOS technology; column-level time-to-digital converter array; fluorescence lifetime imaging; laser source; measurement circuitry; optical rangefinding; photon time-of-arrival evaluation; readout system; signal photon count rates; single-photon avalanche diodes; single-photon image sensor; time-correlated single photon counting; time-resolved optical sensing; timing precision; CMOS image sensors; CMOS technology; Diodes; Layout; Optical imaging; Optical sensors; Sensor arrays; Sensor systems; Timing; Ultraviolet sources; 3-D image sensor; Depth sensor; FÖrster Resonance Energy Transfer (FRET); FCS; Geiger-mode avalanche photodiode; SPAD; TCSPC; flash laser camera; fluorescence lifetime imaging microscopy (FLIM); range imaging; rangefinder; single-photon avalanche diode; single-photon detector; solid-state 3-D imaging; time-correlated single-photon counting; time-of-flight;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2008.2006445