DocumentCode :
1002789
Title :
A 10.3 Gb/s Burst-Mode CDR Using a ΔΣ DAC
Author :
Terada, Jun ; Nishimura, Kazuyoshi ; Kimura, Shunji ; Katsurai, Hiroaki ; Yoshimoto, Naoto ; Ohtomo, Yusuke
Author_Institution :
NTT Microsyst. Integration Labs., Japan
Volume :
43
Issue :
12
fYear :
2008
Firstpage :
2921
Lastpage :
2928
Abstract :
A burst-mode clock and data recovery circuit (CDR) for 10 G-EPON systems is described. We propose a new architecture with a single gated voltage-controlled oscillator (GVCO), a digital frequency detector, and a ΔΣ digital-to-analog converter (DAC). The single GVCO and detector reduce frequency error to less than 2 MHz. The ΔΣ DAC eliminates external devices. Moreover, the simulation results show the DAC is more tolerant to process, voltage, and temperature (PVT) variations than a conventional charge pump. We fabricated a test CDR with this architecture using the 0.25 μm SiGe BiCMOS process. The measurement results show root-mean-square (rms) and total jitter of the recovered data of 2.4 and 14.7 ps, respectively, instantaneous locking in 1 bit, tolerance to a 160-bit sequence without transition in the data, and jitter tolerance of over 0.27 UIpp.
Keywords :
δ-σ modulation; BiCMOS integrated circuits; CMOS integrated circuits; clock and data recovery circuits; detector circuits; jitter; local area networks; optical fibre networks; silicon compounds; voltage-controlled oscillators; ΔΣ digital-to-analog converter; BiCMOS process; SiGe; bit rate 10.3 Gbit/s; burst-mode clock circuit; data recovery circuit; digital frequency detector; frequency error reduction; gigabit Ethernet passive optical network systems; jitter tolerance; root-mean-square; single gated voltage-controlled oscillator; size 0.25 μm; temperature variations; time 14.7 ps; time 2.4 ps; Charge pumps; Circuits; Clocks; Detectors; Digital-analog conversion; Frequency conversion; Jitter; Temperature; Voltage; Voltage-controlled oscillators; σ-δ modulation; High-speed integrated circuits; optical communication; receivers;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2008.2006229
Filename :
4684637
Link To Document :
بازگشت