DocumentCode :
1003481
Title :
Definition of residual error model for network analyser measurements
Author :
Pasquet, Daniel ; Abdellaoui, Mahmoud ; Gautier, Jean-Luc ; Verdier, A.
Author_Institution :
ENSEA, Cergy Pontoise, France
Volume :
28
Issue :
15
fYear :
1992
fDate :
7/16/1992 12:00:00 AM
Firstpage :
1426
Lastpage :
1428
Abstract :
The measurement of S parameters with a network analyser is affected by both systematic and random errors. Several error models exist for systematic errors. A similar model is proposed to evaluate the random errors which affect the measured values of S parameters when systematic errors have been extracted. This error model is independent of the measured DUT and characterises only the sensitivity of a given calibration procedure to random error. A simulation on a TRL calibration is shown as an example.
Keywords :
S-parameters; calibration; measurement errors; microwave measurement; network analysers; TRL calibration; calibration procedure; error models; network analyser measurements; random errors; residual error model; sensitivity; simulation; systematic errors; thru-reflect-line calibration;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19920907
Filename :
256054
Link To Document :
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