مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

1003653

Title :

Selftesting CMOS operational amplifier

Author :

Roca, M. ; Rubio, Albert

Author_Institution :

Dept. of Phys., Univ. Illes Balears, Palma de Mallorca, Spain

Volume :

Issue :

fYear :

1992

fDate :

7/16/1992 12:00:00 AM

Firstpage :

1452

Lastpage :

1454

Abstract :

The testability of failures modelled by bridges and stuck-open faults in CMOS current mode based operational amplifiers is investigated. The functional and I_DD current effects caused by these types of failure in the circuits are presented. A current sensing circuit oriented to BIST, based on current mirrors is also developed. From these results, a selftesting operational amplifier circuit is proposed.

Keywords :

CMOS integrated circuits; built-in self test; failure analysis; integrated circuit testing; linear integrated circuits; operational amplifiers; BIST; CMOS operational amplifier; bridges; current mirrors; current mode; current sensing circuit; failures; self test opamp; selftesting op amp; stuck-open faults; testability;

fLanguage :

English

Journal_Title :

Electronics Letters

Publisher :

iet

ISSN :

0013-5194

Type :

jour

DOI :

10.1049/el:19920924

Filename :

256069

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1003653