Title :
Variance analysis of frequency response function measurements using periodic excitations
Author :
Haene, Tom D. ; Pintelon, Rik ; Schoukens, Johan ; Gheem, Els Van
Author_Institution :
Dept. ELEC, Vrije Univ. Brussel, Brussels, Belgium
Abstract :
The influence of disturbing noise and nonlinear distortions on frequency response function measurements using periodic excitations has been studied in detail in the literature. A variance analysis method has been developed that allows one to detect and quantify the nonlinear distortions and the disturbing noise. In this paper, the variance analysis is generalized to detect and quantify the following nonstationary disturbances: 1) nonsynchronous periodic signals, for example, the 50 Hz mains and its harmonics, and 2) nonstationary behavior of the device under test, for example, phase or frequency modulation.
Keywords :
electronic equipment testing; frequency response; nonlinear distortion; power system harmonics; signal detection; statistical analysis; disturbing noise; frequency modulation; frequency response function measurements; nonlinear distortions; nonstationary behavior; nonstationary disturbances; nonsynchronous periodic signals; periodic excitations; phase modulation; variance analysis; Analysis of variance; Distortion measurement; Frequency measurement; Frequency response; Harmonic analysis; Noise measurement; Nonlinear distortion; Phase detection; Phase frequency detector; Signal analysis; Frequency response function (FRF) measurements; nonlinear distortions; nonstationary distortions; nonsynchronous periodic signals; variance analysis;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2005.851075