Title :
Homogeneity studies of amorphous TbFe films by Kerr and Hall effect methods
Author :
Chen, Tu ; Malmhäll, R.
Author_Institution :
Komag Inc., Milpitas, CA
fDate :
9/1/1984 12:00:00 AM
Abstract :
The homogeneity of amorphous TbFe thin films was examined, utilizing variable phase retardation in polar Kerr effect measurements in conjunction with extraordinary Hall effect studies. These techniques were suggested as very useful tools to study film homogeneity in amorphous rare earth-transition metal thin films with composition close to the compensation composition.
Keywords :
Amorphous magnetic films/devices; Hall effect; Magnetic measurements; Magnetooptic Kerr effect; Amorphous materials; Hall effect; Hysteresis; Kerr effect; Magnetooptic effects; Material storage; Optical films; Phase measurement; Polarization; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1984.1063289
