• DocumentCode
    1004096
  • Title

    Modeling of switched-capacitor delta-sigma Modulators in SIMULINK

  • Author

    Zare-Hoseini, Hashem ; Kale, Izzet ; Shoaei, Omid

  • Author_Institution
    Appl. DSP & VLSI Res. Group, Univ. of Westminster, London, UK
  • Volume
    54
  • Issue
    4
  • fYear
    2005
  • Firstpage
    1646
  • Lastpage
    1654
  • Abstract
    Precise behavioral modeling of switched-capacitor ΔΣ modulators is presented. Considering noise (switches´ and op-amps´ thermal noise), clock jitter, nonidealities of integrators and op-amps including finite dc-gain (DCG) and unity gain bandwidth, slew-limiting, DCG nonlinearities and the input parasitic capacitance, quantizer hysteresis, switches´ clock-feedthrough, and charge injection, exhaustive behavioral simulations that are close models of the transistor-level ones can be performed. The DCG nonlinearity of the integrators, which is not considered in many ΔΣ modulators´ modeling attempts, is analyzed, estimated, and modeled. It is shown that neglecting this parameter would lead to a significant underestimation of the modulators´ behavior and increase the noise floor as well as the harmonic distortion at the output of the modulator. Evaluation and validation of the models were done via behavioral and transistor-level simulations for a second-order modulator using SIMULINK and HSPICE with a generic 0.35-μm CMOS technology. The effects of the nonidealities and nonlinearities are clearly seen when compared to the ideal modulator in the behavioral and actual modulator in the circuit-level environment.
  • Keywords
    CMOS digital integrated circuits; circuit simulation; delta-sigma modulation; integrated circuit modelling; integrated circuit noise; jitter; switched capacitor networks; 0.35 micron; CMOS digital integrated circuits; DCG integrator nonlinearity; SIMULINK; behavioral modeling; behavioral simulation; circuit simulation; clock jitter; integrated circuit modeling; integrated circuit noise; switched-capacitor ΔΣ modulators; switched-capacitor delta-sigma modulators; transistor-level simulation; Bandwidth; CMOS technology; Clocks; Delta modulation; Hysteresis; Jitter; Operational amplifiers; Parasitic capacitance; Performance gain; Switches; Charge injection; SIMULINK; clock feedthrough; correlated double sampling; delta–sigma modulators; hysteresis; nonideality; nonlinearity; switched capacitor;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2005.851085
  • Filename
    1468583