Measurement of perpendicularity of magnetic field in polar Kerr magnetooptical loop tracer using nickel film with oblique magnetic anisotropy

This paper introduces an original method to measure the degree of perpendicularity of magnetic field in the polar Kerr magnetooptical hysteresis loop tracer using an evaporated nickel thin film with oblique uniaxial magnetic anisotropy. In this method, the inclination angle of the magnetic field from the film normal of the sample can be obtained from the ratio of the maximum coercivity to the minimum one of the Hall or polar Kerr loop when the Ni film is rotated on the sample stage.