DocumentCode :
1004332
Title :
Measurement of diffracted electromagnetic fields behind a thin finite-width screen
Author :
Van Dooren, G.A.J. ; Herben, M.H.A.J.
Author_Institution :
Eindhoven Univ. of Technol., Netherlands
Volume :
28
Issue :
19
fYear :
1992
Firstpage :
1845
Lastpage :
1847
Abstract :
A comparison between the measured and theoretically predicted site shielding factor (SSF) of a thin finite-width screen is made. The SSF, which expresses the additional attenuation caused by an obstacle on the propagation path, is measured along a cylindrical arc behind the screen at a frequency of 50 GHz. The measured SSF curves compare very well with those predicted by a theoretical model, which uses the uniform geometrical theory of diffraction (UTD) and includes corner diffraction. The same holds for the measured and theoretically derived time-domain results, which clearly demonstrate the ray behaviour of the diffracted fields, as assumed in the UTD.
Keywords :
electromagnetic wave diffraction; radiowave propagation; shielding; 50 GHz; EHF; UTD; attenuation; corner diffraction; diffracted electromagnetic fields; microwave; obstacle; propagation path; site shielding factor; thin finite-width screen; uniform geometrical theory of diffraction;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19921177
Filename :
256134
Link To Document :
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