Title :
The measurement of magneto-optic constants of thin transparent films
Author :
Smith, A.B. ; Bekebrede, W.R. ; Kestigian, M.
fDate :
9/1/1984 12:00:00 AM
Abstract :
An ellipsometric technique for measuring the magneto-optic constants of ferro- and ferrimagnetic materials is described. The necessary apparatus is outlined, and the equations necessary for data reduction are given. Unlike previous work, these equations permit the measurement of thin transparent films. Typical results on magneto-optic garnets are presented.
Keywords :
Magnetooptic materials/devices; Magnetooptic measurements; Amplifiers; Artificial intelligence; Computer aided instruction; Detectors; Equations; Light sources; Magnetooptic effects; Optical polarization; Peak to average power ratio; Silicon;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1984.1063310
