• DocumentCode
    1004436
  • Title

    Maximum income approach to yield optimisation

  • Author

    Opalski, Leszek J. ; Styblinski, M.A.

  • Author_Institution
    Texas A&M University, Department of Electrical Engineering, College Station, USA
  • Volume
    21
  • Issue
    17
  • fYear
    1985
  • Firstpage
    734
  • Lastpage
    736
  • Abstract
    A new approach to yield optimisation is proposed, based on the maximisation of the expected manufacturer´s income, expressed through a newly introduced yield measure called `income (or profit) yield index¿. The measure takes into account the price decrease of inferior designs, and it can be maximised using the existing methods of yield optimisation with insignificant additional computational cost.
  • Keywords
    circuit theory; optimisation; statistical analysis; acceptability region; circuit performance; circuit theory; income yield index; maximisation; maximum income approach; statistical design centering; yield optimisation;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19850518
  • Filename
    4250727