Title :
Maximum income approach to yield optimisation
Author :
Opalski, Leszek J. ; Styblinski, M.A.
Author_Institution :
Texas A&M University, Department of Electrical Engineering, College Station, USA
Abstract :
A new approach to yield optimisation is proposed, based on the maximisation of the expected manufacturer´s income, expressed through a newly introduced yield measure called `income (or profit) yield index¿. The measure takes into account the price decrease of inferior designs, and it can be maximised using the existing methods of yield optimisation with insignificant additional computational cost.
Keywords :
circuit theory; optimisation; statistical analysis; acceptability region; circuit performance; circuit theory; income yield index; maximisation; maximum income approach; statistical design centering; yield optimisation;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19850518
