DocumentCode
1004436
Title
Maximum income approach to yield optimisation
Author
Opalski, Leszek J. ; Styblinski, M.A.
Author_Institution
Texas A&M University, Department of Electrical Engineering, College Station, USA
Volume
21
Issue
17
fYear
1985
Firstpage
734
Lastpage
736
Abstract
A new approach to yield optimisation is proposed, based on the maximisation of the expected manufacturer´s income, expressed through a newly introduced yield measure called `income (or profit) yield index¿. The measure takes into account the price decrease of inferior designs, and it can be maximised using the existing methods of yield optimisation with insignificant additional computational cost.
Keywords
circuit theory; optimisation; statistical analysis; acceptability region; circuit performance; circuit theory; income yield index; maximisation; maximum income approach; statistical design centering; yield optimisation;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19850518
Filename
4250727
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