• DocumentCode
    1004620
  • Title

    On a two-scatterer theory of sea echo

  • Author

    Long, Maurice W.

  • Author_Institution
    Georgia Institute of Technology, Atlanta, GA, USA
  • Volume
    22
  • Issue
    5
  • fYear
    1974
  • fDate
    9/1/1974 12:00:00 AM
  • Firstpage
    667
  • Lastpage
    672
  • Abstract
    Results of visual observations and statistical analyses on the polarization dependence of fluctuations in radar echo are given. Some data are also given on relative power, as a function of polarization, contained in the two distinctly different fluctuation spectra observed. The fast fluctuations are from wind ripples, and the slower fluctuations are strongly dependent on the sea structure. The information on fluctuations is given as support of a two-scatterer concept for sea echo. The scatterers are: 1) a wind-dependent fine structure of the sea (ripples) interspersed with 2) smooth areas (facets) of the wave structure. The composite theory for rough surfaces developed recently in both the United States and the Soviet Union predicts that average radar cross section of sea echo for transmitting and receiving horizontal polarization never exceeds that for vertical polarization. However, measurements at near grazing incidence yield average HH cross sections that sometimes exceed average VV cross sections, and the observations reported herein suggest that reflection from facets is the cause. The composite theory includes the facets only in the sense of varying the slope of the waves on which the ripples are located. Therefore, the need is emphasized for a sea echo theory that is applicable to small incidence angles and includes the effects of the facets.
  • Keywords
    Sea surface electromagnetic scattering; Fluctuations; Polarization; Radar cross section; Radar scattering; Reflection; Rough surfaces; Sea measurements; Sea surface; Statistical analysis; Surface roughness;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.1974.1140870
  • Filename
    1140870