Title :
Direct electro-optic sampling of GaAs integrated circuits
Author :
Weingarten, Kurt J. ; Rodwell, Mark J. W. ; Heinrich, H.K. ; Kolner, B.H. ; Bloom, D.M.
Author_Institution :
Stanford University, Edward L. Ginzton Laboratory, Stanford, USA
Abstract :
We report the first electro-optic sampling measurements made directly within an integrated circuit. Using the electro-optic effect in GaAs, we have noninvasively probed the internal voltage waveforms of a 2¿12 GHz GaAs FET travelling-wave amplifier integrated circuit driven by a microwave signal source.
Keywords :
III-V semiconductors; electro-optical effects; gallium arsenide; integrated circuit testing; measurement by laser beam; microwave integrated circuits; 2 GHz to 12 GHz; FET travelling-wave amplifier; GaAs integrated circuits; IC testing; MMIC; Nd:YAG laser; SHF; electro-optic sampling; internal voltage waveforms; microwave signal source; monolithic microwave IC; noninvasive probe measurement;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19850539
