DocumentCode :
1004842
Title :
Magnetron sputtering of permalloy for thin-film heads
Author :
Potzlberger, H.W.
Author_Institution :
IEEE, TMAG
Volume :
20
Issue :
5
fYear :
1984
fDate :
9/1/1984 12:00:00 AM
Firstpage :
851
Lastpage :
853
Abstract :
Thick permalloy films, as needed für magnetic recording heads, lend themselves to sputtering with the high-rate magnetron method. Special magnetron cathodes, with a field strength about three times higher than usual, have been used. With a 6 mm thick target, more than 900 substrates (diameter 7.62 cm) can be deposited with one micron of permalloy. The sputtering rates were about 100 to 150 nm/min. DC bias of about 100 V and a magnetic field of ≥35 A/cm were needed for anisotropy and soft magnetic film properies. Argon-nitrogen mixtures were used as the sputtering gas, the nitrogen content being 0 to 2.8 %. Electrical resistivity and coercivity values are given for film thicknesses between 0.13 and 2 microns. Film composition was measured by X-ray fluorescence and AES methods. Though the nitrogen content in the film is smaller than 0.5 % (mole fraction), the coercivity shows a rapid decrease from 0.4 to 0.2 A/cm with increasing nitrogen in the sputtering gas. The same results have been found also for NiFe films, sputtered in a conventional RF-diode sputtering machine.
Keywords :
Magnetic recording/reading heads; Magnetrons; Permalloy films/devices; Sputtering; Coercive force; Magnetic anisotropy; Magnetic field measurement; Magnetic films; Magnetic heads; Magnetic recording; Nitrogen; Perpendicular magnetic anisotropy; Soft magnetic materials; Sputtering;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1984.1063356
Filename :
1063356
Link To Document :
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