• DocumentCode
    1004842
  • Title

    Magnetron sputtering of permalloy for thin-film heads

  • Author

    Potzlberger, H.W.

  • Author_Institution
    IEEE, TMAG
  • Volume
    20
  • Issue
    5
  • fYear
    1984
  • fDate
    9/1/1984 12:00:00 AM
  • Firstpage
    851
  • Lastpage
    853
  • Abstract
    Thick permalloy films, as needed für magnetic recording heads, lend themselves to sputtering with the high-rate magnetron method. Special magnetron cathodes, with a field strength about three times higher than usual, have been used. With a 6 mm thick target, more than 900 substrates (diameter 7.62 cm) can be deposited with one micron of permalloy. The sputtering rates were about 100 to 150 nm/min. DC bias of about 100 V and a magnetic field of ≥35 A/cm were needed for anisotropy and soft magnetic film properies. Argon-nitrogen mixtures were used as the sputtering gas, the nitrogen content being 0 to 2.8 %. Electrical resistivity and coercivity values are given for film thicknesses between 0.13 and 2 microns. Film composition was measured by X-ray fluorescence and AES methods. Though the nitrogen content in the film is smaller than 0.5 % (mole fraction), the coercivity shows a rapid decrease from 0.4 to 0.2 A/cm with increasing nitrogen in the sputtering gas. The same results have been found also for NiFe films, sputtered in a conventional RF-diode sputtering machine.
  • Keywords
    Magnetic recording/reading heads; Magnetrons; Permalloy films/devices; Sputtering; Coercive force; Magnetic anisotropy; Magnetic field measurement; Magnetic films; Magnetic heads; Magnetic recording; Nitrogen; Perpendicular magnetic anisotropy; Soft magnetic materials; Sputtering;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1984.1063356
  • Filename
    1063356