Title :
Alpha-particle-induced failure modes in dynamic RAMs
Author :
Carter, P.M. ; Wilkins, B.R.
Author_Institution :
Southampton University, Department of Electronics & Information Engineering, Southampton, UK
Abstract :
The alpha-particle-induced soft error rates of 64K D-RAMs made by five leading manufacturers have been compared. Different samples from the same manufacturer, and those from four different manufacturers, are all shown to be very similar, but the fifth manufacturers product has a soft error rate that is an order of magnitude larger than the others. The results also suggest that, for most products, sensitivity is in the bit lines or sense amplifiers, while for those from the fifth manufacturer it resides in the cells.
Keywords :
alpha-particle effects; integrated memory circuits; large scale integration; random-access storage; 64K D-RAMs; alpha-particle-induced soft error rates; bit lines; sense amplifiers;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19850029
