Title :
Group parity prediction scheme for concurrent testing of linear feedback shift registers
Author :
Vasanthavada, N.S.
Author_Institution :
Duke University, Department of Electrical Engineering, Durham, USA
Abstract :
A group parity prediction scheme which can be used for concurrent testing of linear feedback shift register circuits is described.
Keywords :
logic testing; shift registers; concurrent testing; group parity prediction scheme; linear feedback shift registers; transient fault detection;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19850046
