Title :
Testing and Evaluation of Insulating Films Part II: Test Results Using Facilities at the University at Buffalo
Author :
Laghari, J.R. ; Kumar, K. ; Hammoud, A. ; Bilodeau, T. ; Treanor, M. ; Cygan, S. ; Shea, J. ; Kraus, R. ; Fitzpatrick, G.
Author_Institution :
State University of New York
Abstract :
In this second part of a two-part article, representative data using the insulation test facilities at the University at Buffalo is presented. It is also shown how this data is useful toward the design of reliable high voltage systems.
Keywords :
Annealing; Crystallization; Dielectric measurements; Insulation testing; Morphology; Optical films; Temperature; X-ray diffraction;
Journal_Title :
Electrical Insulation Magazine, IEEE
DOI :
10.1109/MEI.1986.290503
