Title :
Method of simplified analysis of switched-capacitor networks
Author :
Mulawka, J.J. ; Moschytz, G.S.
Author_Institution :
Swiss Federal Institute of Technology, Institute of Telecommunication, ETH Centre, Zÿrich, Switzerland
Abstract :
A simple by-inspection method is described for the z-domain analysis of switched-capacitor networks. The approach is based on the nodal admittance matrix and a concept of basic elements for the switched capacitor.
Keywords :
linear network analysis; switched capacitor networks; basic elements; nodal admittance matrix; switched-capacitor networks; z-domain analysis;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19850098
