DocumentCode
1006401
Title
Dependence of linewidth enhancement factor α on waveguide structure in semiconductor lasers
Author
Furuya, Keiichi
Author_Institution
Tokyo Institute of Technology, Department of Physical Electronics, Tokyo, Japan
Volume
21
Issue
5
fYear
1985
Firstpage
200
Lastpage
201
Abstract
In semiconductor lasers, the ratio α of the real part to the imaginary part of the change in refractive index due to the change in carrier density determines the magnitude of dynamic and static line broadenings. The letter reports that the effective value of α depends on the structure of the waveguide, where both index and gain mechanisms induce transverse-mode guiding.
Keywords
optical waveguides; refractive index; semiconductor junction lasers; spectral line breadth; carrier density; dynamic line broadening; gain mechanisms; linewidth enhancement factor; refractive index; semiconductor lasers; static line broadenings; transverse-mode guiding; waveguide structure;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19850141
Filename
4250961
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