Title :
Characterisation of nonlinear thin films using logarithmic Hilbert transform
Author_Institution :
Edward L. Ginzton Lab., Stanford Univ., CA, USA
fDate :
5/25/2006 12:00:00 AM
Abstract :
A new technique based on logarithmic Hilbert transform processing of Maker-fringe curves to characterise second-order optical nonlinear depth profile of thin films is described and demonstrated experimentally. This technique, being analytical, is faster than its iterative alternative. This is the first time that a Hilbert transform based analytical tool has been applied to characterise nonlinear thin films.
Keywords :
Hilbert transforms; nonlinear optics; thin films; Maker-fringe curve; logarithmic Hilbert transform; nonlinear thin film; second-order optical nonlinear depth profile;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20060672