DocumentCode :
1006685
Title :
Characterisation of nonlinear thin films using logarithmic Hilbert transform
Author :
Ozcan, A.
Author_Institution :
Edward L. Ginzton Lab., Stanford Univ., CA, USA
Volume :
42
Issue :
11
fYear :
2006
fDate :
5/25/2006 12:00:00 AM
Firstpage :
647
Lastpage :
649
Abstract :
A new technique based on logarithmic Hilbert transform processing of Maker-fringe curves to characterise second-order optical nonlinear depth profile of thin films is described and demonstrated experimentally. This technique, being analytical, is faster than its iterative alternative. This is the first time that a Hilbert transform based analytical tool has been applied to characterise nonlinear thin films.
Keywords :
Hilbert transforms; nonlinear optics; thin films; Maker-fringe curve; logarithmic Hilbert transform; nonlinear thin film; second-order optical nonlinear depth profile;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:20060672
Filename :
1648614
Link To Document :
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