• DocumentCode
    1006710
  • Title

    A finite difference approach to the wire junction problem

  • Author

    Mittra, Raj ; Ko, W.L.

  • Author_Institution
    University of Illinois, Urbana, IL, USA
  • Volume
    23
  • Issue
    3
  • fYear
    1975
  • fDate
    5/1/1975 12:00:00 AM
  • Firstpage
    435
  • Lastpage
    438
  • Abstract
    An approach to treating the thin-wire junction geometry, which arises in the computer modeling of a great many electromagnetic radiation and scattering problems, is presented. The method is based upon a finite-difference type interpretation of the differential operator in the Pocklington form of the integro-differential equation representing the junction problem. An important advantage of the method is that it is capable of producing accurate results even with relatively simple basis and testing functions, e.g., pulse and \\delta -functions. Furthermore, the method does not require the imposition of additional constraints, such as the Kirchhoff current law or the conservation of charge, at the junction points. The method is versatile in that it applies to L-shaped structures as well as to junctions of thin wires of dissimilar radii. Numerical results based on the present finite difference approach have been computed and good agreement with results derived by other independent methods has been observed. An important conclusion of this work is that the conventional interpretation of the differential operator leads to erroneous results since the sampling interval in the conventional finite difference scheme is different from the correct value of the sampling interval found in this paper.
  • Keywords
    Finite difference methods; Wire antennas; Wire scatterers; Computational geometry; Electromagnetic modeling; Electromagnetic radiation; Electromagnetic scattering; Finite difference methods; Integrodifferential equations; Sampling methods; Solid modeling; Testing; Wire;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.1975.1141076
  • Filename
    1141076