DocumentCode :
1007275
Title :
LESS: a model-based classifier for sparse subspaces
Author :
Veenman, Cor J. ; Tax, David M J
Author_Institution :
Dept. of Mediamatics, Delft Univ. of Technol., Netherlands
Volume :
27
Issue :
9
fYear :
2005
Firstpage :
1496
Lastpage :
1500
Abstract :
In this paper, we specifically focus on high-dimensional data sets for which the number of dimensions is an order of magnitude higher than the number of objects. From a classifier design standpoint, such small sample size problems have some interesting challenges. The first challenge is to find, from all hyperplanes that separate the classes, a separating hyperplane which generalizes well for future data. A second important task is to determine which features are required to distinguish the classes. To attack these problems, we propose the LESS (lowest error in a sparse subspace) classifier that efficiently finds linear discriminants in a sparse subspace. In contrast with most classifiers for high-dimensional data sets, the LESS classifier incorporates a (simple) data model. Further, by means of a regularization parameter, the classifier establishes a suitable trade-off between subspace sparseness and classification accuracy. In the experiments, we show how LESS performs on several high-dimensional data sets and compare its performance to related state-of-the-art classifiers like, among others, linear ridge regression with the LASSO and the support vector machine. It turns out that LESS performs competitively while using fewer dimensions.
Keywords :
data handling; pattern classification; high-dimensional data sets; linear discriminants; linear ridge regression; lowest error in a sparse subspace; model-based classifier; support vector machine; Computational modeling; Data models; Filtering; Genetic algorithms; Mathematical programming; Robustness; Simulated annealing; Support vector machine classification; Support vector machines; Thumb; Index Terms- Classification; feature subset selection; high-dimensional; mathematical programming.; support vector machine; Algorithms; Artificial Intelligence; Cluster Analysis; Computer Simulation; Information Storage and Retrieval; Models, Statistical; Pattern Recognition, Automated;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2005.182
Filename :
1471714
Link To Document :
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