• DocumentCode
    1007275
  • Title

    LESS: a model-based classifier for sparse subspaces

  • Author

    Veenman, Cor J. ; Tax, David M J

  • Author_Institution
    Dept. of Mediamatics, Delft Univ. of Technol., Netherlands
  • Volume
    27
  • Issue
    9
  • fYear
    2005
  • Firstpage
    1496
  • Lastpage
    1500
  • Abstract
    In this paper, we specifically focus on high-dimensional data sets for which the number of dimensions is an order of magnitude higher than the number of objects. From a classifier design standpoint, such small sample size problems have some interesting challenges. The first challenge is to find, from all hyperplanes that separate the classes, a separating hyperplane which generalizes well for future data. A second important task is to determine which features are required to distinguish the classes. To attack these problems, we propose the LESS (lowest error in a sparse subspace) classifier that efficiently finds linear discriminants in a sparse subspace. In contrast with most classifiers for high-dimensional data sets, the LESS classifier incorporates a (simple) data model. Further, by means of a regularization parameter, the classifier establishes a suitable trade-off between subspace sparseness and classification accuracy. In the experiments, we show how LESS performs on several high-dimensional data sets and compare its performance to related state-of-the-art classifiers like, among others, linear ridge regression with the LASSO and the support vector machine. It turns out that LESS performs competitively while using fewer dimensions.
  • Keywords
    data handling; pattern classification; high-dimensional data sets; linear discriminants; linear ridge regression; lowest error in a sparse subspace; model-based classifier; support vector machine; Computational modeling; Data models; Filtering; Genetic algorithms; Mathematical programming; Robustness; Simulated annealing; Support vector machine classification; Support vector machines; Thumb; Index Terms- Classification; feature subset selection; high-dimensional; mathematical programming.; support vector machine; Algorithms; Artificial Intelligence; Cluster Analysis; Computer Simulation; Information Storage and Retrieval; Models, Statistical; Pattern Recognition, Automated;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2005.182
  • Filename
    1471714