Title : 
Lateral epitaxial overgrowth of silicon over recessed oxide
         
        
            Author : 
Jayadev, T.S. ; Okazaki, E. ; Petersen, Hauke ; Millman, M.
         
        
            Author_Institution : 
Lockheed Missiles & Space Co., Lockheed Palo Alto Research Laboratory, Palo Alto, USA
         
        
        
        
        
        
        
            Abstract : 
There has been considerable interest in silicon-on-insulator (SOI) technology recently because of its potential applications in VLSI. CMOS circuits in SOI have higher speed because of the absence of substrate capacitance, and freedom from latch-up because of dielectric isolation. Recently, memory circuits like DRAMs have reached the physical limits of what is possible in two dimensions, and hence there is a growing need for 3-dimensional circuits. SOI offers a possible avenue to realise such 3-D circuits and thus lead the way to the next generation of memories and integrated circuits.
         
        
            Keywords : 
VLSI; elemental semiconductors; integrated circuit technology; semiconductor epitaxial layers; semiconductor growth; silicon; 3-dimensional circuits; CMOS; SOI; Si; VLSI; lateral epitaxial overgrowth; memory circuits; silicon-on-insulator;
         
        
        
            Journal_Title : 
Electronics Letters
         
        
        
        
        
            DOI : 
10.1049/el:19850231