DocumentCode
1007420
Title
Random Walk Guided Decap Embedding for Power/Ground Network Optimization
Author
Cai, Yici ; Kang, Le ; Shi, Jin ; Hong, Xianlong ; Tan, Sheldon X -D
Author_Institution
Tsinghua Univ., Beijing
Volume
55
Issue
1
fYear
2008
Firstpage
36
Lastpage
40
Abstract
The reliability of power/ground networks is becoming significantly important in modern integrated circuits, while decap insertion is a main approach to enhance the power grid safety. In this brief, we propose a fast and efficient decap allocation algorithm, and adequately consider the leakage effect of decap. This approach borrows the idea of random walks to perform circuit partitioning and does subsequent decap insertion based on locality property of partitioned area, which avoids solving a large nonlinear programming problem in traditional decap optimization process. The optimization flow also integrates a refined leakage current model for decaps which makes it more practical. Experimental results show that our proposed method can achieve approximate 15 X speed up over the optimal budget method within the acceptable error tolerance. Also this algorithm only causes a few penalty area to compensate the leakage effect.
Keywords
integrated circuit design; integrated circuit interconnections; integrated circuit reliability; leakage currents; nonlinear programming; decap insertion; decap optimization process; integrated circuit interconnections; partitioned nonlinear programming; power-ground IC networks; Inductance; Integrated circuit reliability; Leakage current; Noise reduction; Partitioning algorithms; Power grids; Power system dynamics; Power system reliability; Voltage fluctuations; Wire; Leakage; optimization; power/ground (P/G) network; random walks;
fLanguage
English
Journal_Title
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher
ieee
ISSN
1549-7747
Type
jour
DOI
10.1109/TCSII.2007.909869
Filename
4401876
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