• DocumentCode
    1008563
  • Title

    Shorts due to diagnostic leads

  • Author

    Ellis, J.F. ; Lubell, M.S. ; Walstrom, S. ; Walstrom, P. ; Thome, R.J. ; Pillsbury, R.D.

  • Author_Institution
    Oak Ridge National Laboratory, Oak Ridge, Tennessee
  • Volume
    21
  • Issue
    2
  • fYear
    1985
  • fDate
    3/1/1985 12:00:00 AM
  • Firstpage
    1060
  • Lastpage
    1063
  • Abstract
    The superconducting toroidal field coils that are being tested in the Large Coil Test Facility (LCTF) are heavily instrumented. In the General Electric coil, a lead wire of an internal sensor became shorted across an estimated three or four turns of the pancake winding. This short occurred during the final stages of the winding fabrication and was not accessible for repair. Resistance, voltage gradient, and transient voltage decay measurements were performed to characterize the short and the magnetic damping of the large steel bobbin and outer structural ring. The 32-gage wire causing the short was estimated to be about 10 cm long, with a resistance of 55 mΩ. As a safety measure, we decided to Burn out the shorted wire at room temperature before installing the coil in LCTF. Tests were made to determine the energy needed to vaporize a small wire. Computer calculations indicated that within the voltage limits set for the coil, it was not feasible to burn out the wire by rapidly dumping the coil from a low-current dc charge-up. We accomplished the burnout by applying 800 V at 3.25 A, and 60 Hz for about 1 s. Transient voltage decay measurements made after the burnout and compared with those made before the attempt confirmed that the short had indeed been opened.
  • Keywords
    Superconducting coils; Electrical resistance measurement; Fabrication; Instruments; Magnetic sensors; Sensor phenomena and characterization; Superconducting coils; Superconducting filaments and wires; Test facilities; Testing; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1985.1063678
  • Filename
    1063678