• DocumentCode
    1008954
  • Title

    Transistor metrology

  • Author

    Alsberg, D.A.

  • Author_Institution
    Bell Telephone Laboratories, Inc., Murray Hill, N.J.
  • Issue
    3
  • fYear
    1954
  • Firstpage
    12
  • Lastpage
    17
  • fLanguage
    English
  • Journal_Title
    Electron Devices, Transactions of the IRE Professional Group on
  • Publisher
    ieee
  • ISSN
    0197-6370
  • Type

    jour

  • DOI
    10.1109/T-ED.1954.14018
  • Filename
    1471877