Title :
The influence of noisy components on the sensitivity of microwave receivers
Author :
Pritchard, W.L. ; Larkin, K.T.
Author_Institution :
Raytheon Manufacturing Company, Waltham, Mass
Abstract :
The ultimate limit on receiver sensitivity is random noise. In the microwave region where atmospheric and man-made noise are negligible, this elemental random noise comes from thermal agitation and from electron devices. It can be shown that the irreducible minimum noise level is proportional to the effective system bandwidth.
Journal_Title :
Electron Devices, Transactions of the IRE Professional Group on
DOI :
10.1109/T-ED.1954.14026
